By Richard A. Demillo
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Extra resources for Applied Cryptology, Cryptographic Protocols, and Computer Security Models
In this report, class 1 samples are divided into metals, oxides, solutions, ores, and miscellaneous materials. For convenience and uniformity, limits of detectability for class 1 samples are given in parts per million. , on an ion-exchange membrane or filter paper support. Limits of detectability for class 2 samples are generally given in terms of micrograms, since the sensitivity expressed in parts per million depends on both 33 Fluorescent X-ray Spectrography the limit of detectability in micrograms and the original weight of the sample before preconcentration of the trace elements.
This scattering ratio is dependent on the relative abundance of elements of very low atomic number. The applications of this technique may be broadened to include determination of the ratio of metal to oxygen, nitrogen, or carbon. ·Reference to specific brands is made to facilitate understanding and does not imply endorsement of such brands by the Bureau of Mines. 36 William J. Campbell and John W. Thatcher Other spectrographic components that contribute to the background are the collimator plates, analyzing crystal, and detector.
The relationship of intensity to amount for any element present in a thin film is given by the following equation: (3) 51 Fluorescent X-ray Spectrography Rubber Scolch bo nd lope 'St~r--iH-++-- Me m bra n e Wire Fig. 1. Holder for ion-exchange membrane. As X increases, e- x approaches zero; therefore, equation (3) becomes equation (l) at infinite thickness. Figure 2 shows the rapid decrease in transmission when wavelength increases and the thicker Amberplex or lonics membranes are used; whereas the thinner membranes or papers (N alfilm, Reeve Angel) can be used efficiently in the long-wavelength region.
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